Title :
Experimental Results of Built-In Jitter Measurement for Gigahertz Clock
Author :
Cheng, Nai-Chen Daniel ; Lee, Yu ; Chen, Ji-Jan
Author_Institution :
SOC Technol. Center, Ind. Technol. Res. Inst., Hsinchu
Abstract :
This paper demonstrates a built-in jitter measurement (BIJM) circuit for Gigahertz clock. Based on a jitter-amplified technique with a pulse-removing mechanism, the pico-second level resolution is achieved in wide frequency range. The experimental results show the feasibility of the proposed BIJM circuit.
Keywords :
built-in self test; clocks; jitter; logic testing; BIJM circuit; built-in jitter measurement; frequency 1.6 GHz; gigahertz clock; jitter-amplified technique; logic analyzer; pulse-removing mechanism; Bandwidth; Built-in self-test; Circuits; Clocks; Frequency measurement; Gain measurement; Jitter; Pulse amplifiers; Signal resolution; Testing; Jitter Measurement;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.50
