Quasi-analytical analysis of the broadband properties of multiconductor transmission lines on semiconducting substrates

Author

Groteluschen, E. ; Dutta, L.S. ; Zaage, S.

Author_Institution

Lab. fur Informationstechnol., Hannover Univ., Germany

fYear

1994

fDate

19-21 Jan 1994

Firstpage

387

Lastpage

399

Abstract

The electrical properties of single and coupled transmission lines on semiconductor substrates are investigated. The analysis is based on analytical formulas for the frequency-dependent distributed line impedances and admittances. Using these formulas it is possible to characterize the broadband properties of transmission line systems with a minimal amount of computational effort. The validity of the calculated results is proved by comparison with full-wave analyses and experimental data gained from on-chip measurements. A discussion of the calculated line parameters as functions of frequency and substrate conductivity is given. Finally, the influence of the semiconducting substrate on the signal propagation in the time domain is demonstrated by two examples

Keywords

VLSI; distributed parameter networks; frequency-domain analysis; microstrip lines; substrates; time-domain analysis; transmission line theory; VLSI; WSI; admittances; broadband properties; coupled transmission lines; frequency-dependent distributed line impedances; full-wave analyses; multiconductor transmission lines; on-chip measurements; quasi-analytical analysis; semiconducting substrates; signal propagation; single transmission lines; substrate conductivity; time domain; Conductivity; Couplings; Data analysis; Frequency; Gain measurement; Impedance; Semiconductivity; Substrates; Transmission line measurements; Transmission lines;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on

Conference_Location

San Francisco, CA

Print_ISBN

0-7803-1850-1

Type

conf

DOI

10.1109/ICWSI.1994.291230

Filename

291230