• DocumentCode
    1857945
  • Title

    A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC

  • Author

    Yi, Hyunbean ; Park, Sungju ; Kundu, Sandip

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, MA
  • fYear
    2008
  • fDate
    24-27 Nov. 2008
  • Firstpage
    289
  • Lastpage
    294
  • Abstract
    This paper presents design-for-debug (DfD) methods for the reuse of network-on-chip (NoC) as a debug data path in an NoC-based system-on-chip (SoC). We propose on-chip core debug supporting logics which can support transaction-based debug. A debug interface unit is also presented to enable debug data transfer through an NoC between an external debugger and a core-under-debug (CUD). The proposed approach supports debug of designs with multiple clock domains. It also supports collection of trace signatures to facilitate debug of long pattern sequences. Experimental results show that single and multiple stepping through transactions are feasible with moderately low area overhead. We also present simulation result to verify proper operation of the debug components.
  • Keywords
    design for testability; logic design; logic testing; network-on-chip; NoC-based SoC debugging; debug components; debug data transfer; debug interface unit; design-for-debug method; network-on-chip; on-chip core debug; system-on-chip; transaction-based debug; Bandwidth; Clocks; Data engineering; Debugging; Design engineering; Design for disassembly; Logic; Monitoring; Network-on-a-chip; Testing; PSMI; design-for-debug (DfD); network-on-chip (NoC); system-on-chip (SoC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • Conference_Location
    Sapporo
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.15
  • Filename
    4711607