DocumentCode :
1857945
Title :
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC
Author :
Yi, Hyunbean ; Park, Sungju ; Kundu, Sandip
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, MA
fYear :
2008
fDate :
24-27 Nov. 2008
Firstpage :
289
Lastpage :
294
Abstract :
This paper presents design-for-debug (DfD) methods for the reuse of network-on-chip (NoC) as a debug data path in an NoC-based system-on-chip (SoC). We propose on-chip core debug supporting logics which can support transaction-based debug. A debug interface unit is also presented to enable debug data transfer through an NoC between an external debugger and a core-under-debug (CUD). The proposed approach supports debug of designs with multiple clock domains. It also supports collection of trace signatures to facilitate debug of long pattern sequences. Experimental results show that single and multiple stepping through transactions are feasible with moderately low area overhead. We also present simulation result to verify proper operation of the debug components.
Keywords :
design for testability; logic design; logic testing; network-on-chip; NoC-based SoC debugging; debug components; debug data transfer; debug interface unit; design-for-debug method; network-on-chip; on-chip core debug; system-on-chip; transaction-based debug; Bandwidth; Clocks; Data engineering; Debugging; Design engineering; Design for disassembly; Logic; Monitoring; Network-on-a-chip; Testing; PSMI; design-for-debug (DfD); network-on-chip (NoC); system-on-chip (SoC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location :
Sapporo
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3396-4
Type :
conf
DOI :
10.1109/ATS.2008.15
Filename :
4711607
Link To Document :
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