DocumentCode
1857945
Title
A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC
Author
Yi, Hyunbean ; Park, Sungju ; Kundu, Sandip
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, MA
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
289
Lastpage
294
Abstract
This paper presents design-for-debug (DfD) methods for the reuse of network-on-chip (NoC) as a debug data path in an NoC-based system-on-chip (SoC). We propose on-chip core debug supporting logics which can support transaction-based debug. A debug interface unit is also presented to enable debug data transfer through an NoC between an external debugger and a core-under-debug (CUD). The proposed approach supports debug of designs with multiple clock domains. It also supports collection of trace signatures to facilitate debug of long pattern sequences. Experimental results show that single and multiple stepping through transactions are feasible with moderately low area overhead. We also present simulation result to verify proper operation of the debug components.
Keywords
design for testability; logic design; logic testing; network-on-chip; NoC-based SoC debugging; debug components; debug data transfer; debug interface unit; design-for-debug method; network-on-chip; on-chip core debug; system-on-chip; transaction-based debug; Bandwidth; Clocks; Data engineering; Debugging; Design engineering; Design for disassembly; Logic; Monitoring; Network-on-a-chip; Testing; PSMI; design-for-debug (DfD); network-on-chip (NoC); system-on-chip (SoC);
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.15
Filename
4711607
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