• DocumentCode
    1857982
  • Title

    Accelerated Functional Testing of Digital Microfluidic Biochips

  • Author

    Mitra, Debasis ; Ghoshal, Sarmishtha ; Rahaman, Hafizur ; Bhattacharya, Bhargab B. ; Majumder, D.D. ; Chakrabarty, Krishnendu

  • Author_Institution
    West Bengal Univ. of Technol., Kolkata
  • fYear
    2008
  • fDate
    24-27 Nov. 2008
  • Firstpage
    295
  • Lastpage
    300
  • Abstract
    Structural testing of digital microfluidic biochips targets the detection of physical defects, but it does not guarantee robust execution of target bioassays or the integrity of assay outcomes. Functional testing is needed to detect fluidic malfunctions. Such tests ensure whether or not, the elementary fluidic operations, such as droplet transportation, mixing, incubation, and splitting are reliably executed on the microfluidic array. Routing test and mixing/splitting test are two important steps in functional testing. We present two procedures for optimal bidirectional routing test and accelerated mixing/splitting test. Compared to previous methods, these procedures need significantly fewer droplet manipulation steps and reduced execution time. The proposed method of functional testing in an N x N microfluidic array requires only a constant number of mixing/splitting steps. Further, the test outcome is free from boundary errors related to droplet size that may arise during mixing/splitting test.
  • Keywords
    bioMEMS; biomedical electronics; digital integrated circuits; drops; integrated circuit testing; lab-on-a-chip; microfluidics; network routing; wetting; accelerated functional testing; accelerated mixing-splitting test; bidirectional routing test; biochemical analysis; digital microfluidic biochips; droplet size; electrowetting; lab-on-a-chip; microfluidic array; DNA; Diseases; Fluid dynamics; Life estimation; Microfluidics; Robustness; Routing; Sugar; Testing; Transportation; Biochips; digital microfluidics; electrowetting; lab-on-a-chip; testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • Conference_Location
    Sapporo
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.48
  • Filename
    4711608