Title :
Parametrical fault test of CMOS LNA
Author :
Suenaga, K. ; Picos, R. ; Bota, S. ; Roca, M. ; Isern, E. ; Moreno, E. Garcia
Author_Institution :
Phys. Dept., Univ. of Balearic Islands, Palma
Abstract :
This paper presents the circuitry to implement a built-in self test (BiST) strategy for a RF receiver. Using this test strategy fault detection is performed on a LNA. The considered faults are parametrical variations of some LNA elements, and soft opens at selected nodes. After simulations we discuss the detectability margin of these faults. As a rule of thumb, the parametrical faults detectability can be checked by setting them to 50% of the nominal value. In order to classify soft opens as detectable or not, they can be substituted by a 100 Omega resistance.
Keywords :
built-in self test; fault diagnosis; low noise amplifiers; radio receivers; CMOS LNA element; RF receiver; built-in self test strategy; fault detectability; fault detection; low noise amplifier; parametrical fault test; resistance 10 ohm; Automatic testing; Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; RF signals; Radio frequency; Signal generators; System testing;
Conference_Titel :
Devices, Circuits and Systems, 2008. ICCDCS 2008. 7th International Caribbean Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-1956-2
Electronic_ISBN :
978-1-4244-1957-9
DOI :
10.1109/ICCDCS.2008.4542652
