Analysis of emission spectra evolution after accelerated aging of integrated circuits

Author

Ndoye, Amadou C. ; Ben Dhia, S. ; Boyer, Alexandre ; Guillot, Laurent ; Vrignon, Bertrand

Author_Institution

LATTIS - INSA, Toulouse

fYear

2008

fDate

28-30 April 2008

Firstpage

1

Lastpage

5

Abstract

Due to the increasing usage of integrated circuits (ICs) ensuring the electromagnetic compatibility (EMC) of modern electronic systems becomes more and more a major technical challenge. Especially for the automotive industry the undisturbed operation of electronics systems is of vital importance for the safety and the reliability of motorized vehicles. Moreover with CMOS nanometric technologies, new degradation mechanisms at device level appear involving a drift in electromagnetic behavior. This paper presents the evolution of emission spectrum of a mixed component for automotive applications after accelerated aging.

Keywords

CMOS integrated circuits; ageing; automotive electronics; electromagnetic compatibility; integrated circuit testing; life testing; nanotechnology; CMOS nanometric technologies; EMC; accelerated aging; automotive industry; electromagnetic compatibility; emission spectra evolution; integrated circuits; Accelerated aging; Automotive engineering; CMOS technology; Degradation; Electromagnetic compatibility; Electronics industry; Integrated circuit reliability; Integrated circuit technology; Nanoscale devices; Vehicle safety;

fLanguage

English

Publisher

ieee

Conference_Titel

Devices, Circuits and Systems, 2008. ICCDCS 2008. 7th International Caribbean Conference on

Conference_Location

Cancun

Print_ISBN

978-1-4244-1956-2

Electronic_ISBN

978-1-4244-1957-9

Type

conf

DOI

10.1109/ICCDCS.2008.4542653

Filename

4542653