• DocumentCode
    1858291
  • Title

    SCMOS: a software tool for studying the behavior of analog MOS integrated circuits

  • Author

    Farina, José ; Rodríguez-Andina, Juan ; Sanmartín, Luis

  • Author_Institution
    Dept. of Electron. Technol., Vigo Univ., Spain
  • Volume
    3
  • fYear
    2001
  • fDate
    2001
  • Abstract
    The study of analog integrated circuits can be carried out at several levels, from the structure and operation of their basic building blocks to the design methodologies. At any of these levels there is a need for tools that allow the influence of design parameters in the behavior of the circuits to be clearly shown to the students. This paper presents a software tool, namely SCMOS, that allows the functional characteristics of an analog MOS circuit (gain, bandwidth, etc) and their variations due to the modification of design parameters (lengths and widths of transistors, parasitic capacitances, etc) to be checked. Different analyses (transients, AC and DC sweeps) can be performed and their results can be checked in the form of parametric curves, on which the correspondences between parameter variations and functional characteristic variations can be viewed. SCMOS allows a predefined set of topologies, ranging from single-transistor stages to operational amplifiers, to be studied but other topologies can be easily added
  • Keywords
    MOS analogue integrated circuits; circuit analysis computing; computer aided instruction; electronic engineering education; software packages; AC sweeps; DC sweeps; SCMOS software tool; analog MOS intgerated circuits; bandwidth; circuit behaviour; design parameters; gain; operational amplifiers; parametric curves; parasitic capacitances; single-transistor stages; transients analysis; transistors; Analog integrated circuits; Bandwidth; Design methodology; MOSFETs; Operational amplifiers; Parasitic capacitance; Performance analysis; Software tools; Topology; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education Conference, 2001. 31st Annual
  • Conference_Location
    Reno, NV
  • ISSN
    0190-5848
  • Print_ISBN
    0-7803-6669-7
  • Type

    conf

  • DOI
    10.1109/FIE.2001.963961
  • Filename
    963961