Title :
Reconfigurable fault tolerant binary tree-implementation in two-dimensional arrays and reliability analysis
Author :
Takanami, Ituso ; Inoue, Ken ; Watanabe, Takahiro
Author_Institution :
Dept. of Comput. Sci. & Syst. Eng., Yamaguchi Univ., Ube, Japan
Abstract :
We propose a reconfiguration scheme of repairing faulty processors where processors on each level of a binary tree are considered to be a linear array In which spare processors are inserted at regular intervals. The switching networks for compensation are regular and comparatively simple. The logic circuits are simple and their switchings for repair are done autonomously. We give a method of embedding the proposed tree architectures into two-dimensional arrays for WSI implementations. The method embeds the PE´s from the root to a certain level L0 into a rectangular array, which is called a root module. For levels L(>L0), the linear array on each level is partitioned into subarrays. Such subarrays are called level modules. A binary tree-connected computer with a specified height is constructed by embedding these modules into two-dimensional arrays. Next, for the proposed scheme. We derive the necessary and sufficient condition for reconfigurability. Using the result, we obtain a formula for computing system´s reliability. The reliabilities of our systems are compared with those of several systems already known, and the effectiveness of our systems is shown
Keywords :
VLSI; cellular arrays; circuit reliability; fault tolerant computing; logic design; logic testing; microprocessor chips; parallel architectures; redundancy; WSI implementation; compensation; fault tolerant implementation; faulty processor; linear array; logic circuits; reconfigurable binary tree-implementation; reconfiguration scheme; rectangular array; reliability analysis; spare processors; switching networks; tree architectures; two-dimensional arrays; Binary trees; Circuit faults; Fault tolerance; Fault tolerant systems; Logic circuits; Reliability engineering; Sufficient conditions; Switching circuits; Systems engineering and theory; Very large scale integration;
Conference_Titel :
Wafer Scale Integration, 1994. Proceedings., Sixth Annual IEEE International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-1850-1
DOI :
10.1109/ICWSI.1994.291258