RF magnetic emission and electrical coupling in silicon integrated circuits

Author

Gutierrez-D, Edmundo A. ; Garcia-R, Pedro

Author_Institution

Dept. of Electron., INAOE, Puebla

fYear

2008

fDate

28-30 April 2008

Firstpage

1

Lastpage

5

Abstract

This paper introduces an analysis of electromagnetic radiation originated from interconnection lines of integrated circuits (IC). The impact of the signal frequency, the bias conditions, and the geometry and layout of the interconnection structure is also addressed. This analysis is used to understand the potential RF interference that may be caused by this emission, and also to predict on-chip signal integrity and coupling.

Keywords

coupled circuits; electromagnetic waves; geometry; integrated circuit interconnections; integrated circuit layout; monolithic integrated circuits; system-on-chip; RF interference; RF magnetic emission; electrical coupling; electromagnetic radiation; geometry; integrated circuit interconnection lines; interconnection structure layout; on-chip signal integrity; signal coupling; signal frequency; silicon integrated circuit; Coupling circuits; Electromagnetic analysis; Electromagnetic radiation; Geometry; Integrated circuit interconnections; Magnetic analysis; Radio frequency; Radiofrequency integrated circuits; Signal analysis; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Devices, Circuits and Systems, 2008. ICCDCS 2008. 7th International Caribbean Conference on

Conference_Location

Cancun

Print_ISBN

978-1-4244-1956-2

Electronic_ISBN

978-1-4244-1957-9

Type

conf

DOI

10.1109/ICCDCS.2008.4542663

Filename

4542663