DocumentCode :
1858411
Title :
Uniformly doped InAs/GaAs quantum-dot infrared photodetectors with AlGaAs current blocking layer
Author :
Pal, Debdas ; Towe, Elias
Author_Institution :
Dept. of Electr; & Comput; Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
418
Abstract :
We report a study of uniformly doped InAs/GaAs quantum-dot photodetectors with Al0.3Ga0.7As current-blocking layers. The basic device structure contains fifty periods of InAs/GaAs dots. The GaAs barrier layer, as well as the InAs quantum dots, are uniformly doped with Si (2×1016 cm-3) to supply electrons to the quantum-dots. For a -0.3 V bias, the dark current could be reduced by six orders of magnitude when the temperature is lowered from 300 to 78 K. The peak of the photoresponse spectrum of our devices is around 5.5 μm. The large peak energy of about 236 meV and the Δλ/λ∼55% at the peak response suggest that the transitions are from bound levels to the continuum. The peak responsivity of the detectors is about 0.20 Amp/W at 78 K.
Keywords :
III-V semiconductors; aluminium compounds; bound states; dark conductivity; gallium arsenide; indium compounds; infrared detectors; semiconductor quantum dots; silicon; 300 to 78 K; AlGaAs; AlGaAs current blocking layer; GaAs barrier layer; InAs-GaAs quantum-dot infrared photodetectors; InAs-GaAs:Si; Si doping; bound levels; dark current; peak responsivity; photoresponse spectrum; Atomic layer deposition; Current measurement; Dark current; Electromagnetic wave absorption; Gallium arsenide; Molecular beam epitaxial growth; Photodetectors; Quantum dots; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500786
Filename :
1500786
Link To Document :
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