• DocumentCode
    1858411
  • Title

    Uniformly doped InAs/GaAs quantum-dot infrared photodetectors with AlGaAs current blocking layer

  • Author

    Pal, Debdas ; Towe, Elias

  • Author_Institution
    Dept. of Electr; & Comput; Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    418
  • Abstract
    We report a study of uniformly doped InAs/GaAs quantum-dot photodetectors with Al0.3Ga0.7As current-blocking layers. The basic device structure contains fifty periods of InAs/GaAs dots. The GaAs barrier layer, as well as the InAs quantum dots, are uniformly doped with Si (2×1016 cm-3) to supply electrons to the quantum-dots. For a -0.3 V bias, the dark current could be reduced by six orders of magnitude when the temperature is lowered from 300 to 78 K. The peak of the photoresponse spectrum of our devices is around 5.5 μm. The large peak energy of about 236 meV and the Δλ/λ∼55% at the peak response suggest that the transitions are from bound levels to the continuum. The peak responsivity of the detectors is about 0.20 Amp/W at 78 K.
  • Keywords
    III-V semiconductors; aluminium compounds; bound states; dark conductivity; gallium arsenide; indium compounds; infrared detectors; semiconductor quantum dots; silicon; 300 to 78 K; AlGaAs; AlGaAs current blocking layer; GaAs barrier layer; InAs-GaAs quantum-dot infrared photodetectors; InAs-GaAs:Si; Si doping; bound levels; dark current; peak responsivity; photoresponse spectrum; Atomic layer deposition; Current measurement; Dark current; Electromagnetic wave absorption; Gallium arsenide; Molecular beam epitaxial growth; Photodetectors; Quantum dots; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2005. 5th IEEE Conference on
  • Print_ISBN
    0-7803-9199-3
  • Type

    conf

  • DOI
    10.1109/NANO.2005.1500786
  • Filename
    1500786