DocumentCode
1858446
Title
Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault
Author
Lo, Wan-Yu ; Chen, Ching-Yi ; Su, Chin-Lung ; Wu, Cheng-Wen
Author_Institution
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
fYear
2008
fDate
24-27 Nov. 2008
Firstpage
417
Lastpage
422
Abstract
We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memory fault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis.
Keywords
MRAM devices; MRAM specific fault model; MRAM write disturbance fault; RAMSES-M; diagnosis algorithm generation; test algorithms evaluation; weighted fault coverage; Automatic testing; Fault diagnosis; Laboratories; Magnetic analysis; Magnetic tunneling; Nonvolatile memory; Random access memory; Read-write memory; System testing; Technical Activities Guide -TAG; Algorithm generation; fault diagnosis; magnetic random access memory (MRAM); memory testing; weighted fault coverage; write disturbance fault;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
Conference_Location
Sapporo
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.29
Filename
4711626
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