• DocumentCode
    1858446
  • Title

    Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault

  • Author

    Lo, Wan-Yu ; Chen, Ching-Yi ; Su, Chin-Lung ; Wu, Cheng-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu
  • fYear
    2008
  • fDate
    24-27 Nov. 2008
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memory fault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis.
  • Keywords
    MRAM devices; MRAM specific fault model; MRAM write disturbance fault; RAMSES-M; diagnosis algorithm generation; test algorithms evaluation; weighted fault coverage; Automatic testing; Fault diagnosis; Laboratories; Magnetic analysis; Magnetic tunneling; Nonvolatile memory; Random access memory; Read-write memory; System testing; Technical Activities Guide -TAG; Algorithm generation; fault diagnosis; magnetic random access memory (MRAM); memory testing; weighted fault coverage; write disturbance fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • Conference_Location
    Sapporo
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.29
  • Filename
    4711626