Abstract :
The following topics are dealt with: 6T SRAM; FPGA; On-chip self test signature; MOSFET; programmable system-on-chip; NoC architecture; and CNTFET.
Keywords :
MOSFET; SRAM chips; built-in self test; carbon nanotube field effect transistors; field programmable gate arrays; integrated circuit testing; network-on-chip; 6T SRAM; CNTFET; FPGA; MOSFET; NoC architecture; on-chip self test signature; programmable system-on-chip;
Conference_Titel :
VLSI Systems, Architecture, Technology and Applications (VLSI-SATA), 2015 International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-1-4799-7925-7
DOI :
10.1109/VLSI-SATA.2015.7050450
