DocumentCode :
1858724
Title :
A non-arduous way to do signal routing
Author :
Kirkland, Larry V.
Author_Institution :
WesTest Eng., Farmington, UT, USA
fYear :
2012
fDate :
10-13 Sept. 2012
Firstpage :
341
Lastpage :
346
Abstract :
There has been much work, re-work, duplicating work, test & find work, mind boggling work and just plain time consuming engineering work performed to accomplish optimal signal routing from the Interface Test Adapter (ITA) to the instrument. Accomplishments and technology improvements often get discarded or overlooked. All too often, the workforce starts at ground zero for every TPS routing scheme. Optimally, it would be beneficial to establish a minimum set of requirements for any given TPS Software Development Environment (SDE) signal routing automation. When new or better techniques are invented and proven then the requirements should be upgraded. At a minimum, the user should be able to enter an Interface Definition where each UUT signal and pin is defined and enter the ITA Database Information by selecting an interface pin for each Unit Under Test (UUT) connection then the SDE should automate the routing. Also, as an option, the user should be able to manually select the routing desired from the ITA to the instrument. This paper will show a non-arduous way or automated way to do signal routing on complex Automatic Test Equipment (ATE) platforms. The paper will present a set of requirements and more or less set an initial standard. Another factor is the SDE output data should be used by the Test Executive to provide the user with all pertinent ATE to UUT routing information. This is extremely beneficial in determining station problems and verifying optimal routing. So, the SDE (coupled with the compiler) and the Test Executive should both handle and present all pertinent information associated with routing.
Keywords :
automatic test equipment; computerised instrumentation; network routing; signal processing equipment; ITA Database; SDE output data; TPS Software Development Environment; automatic test equipment platform; interface test adapter; optimal automated signal routing; Databases; Hardware; Instruments; Relays; Routing; Software; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4673-0698-0
Type :
conf
DOI :
10.1109/AUTEST.2012.6334514
Filename :
6334514
Link To Document :
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