Title :
Mechanical and electrical properties evaluation of carbon nanowire using electrostatic actuated nano tensile testing devices (EANAT)
Author :
Kiuchi, Mario ; Isono, Yoshitada ; Sugiyama, Susumu ; Morita, Takahiro ; Matsui, Shinji
Author_Institution :
Graduate Sch. of Sci. & Eng., Ritsumeikan Univ., Shiga, Japan
Abstract :
This research develops electrostatic actuated nano tensile testing devices named EANAT to evaluate mechanical and electrical properties of carbon nanowire fabricated by focus ion beam assisted chemical vapor deposition (FIB-CVD). Carbon nano structures are one of promising nanomaterials used for NEMS. This research carried out nanoscale uniaxial tensile test and I-V characteristics measurement of 85 nm-diametric carbon nanowire using EANAT. Young´s modulus of carbon nanowires averaged 80 GPa, which is close to reported values of ultra-thin diamond-like carbon films. The tensile strength of nanowires was also 6 GPa in average. The electrical resistivity is about 0.015 Ωm.
Keywords :
Young´s modulus; carbon; electrical resistivity; electrostatic actuators; nanowires; tensile strength; tensile testing; 0.015 ohmm; 85 nm; C; I-V characteristics; NEMS; Young modulus; carbon nanostructures; carbon nanowire; electrical properties; electrical resistivity; electrostatic actuated nano tensile testing devices; focus ion beam assisted chemical vapor deposition; mechanical properties; nanomaterials; nanoscale uniaxial tensile test; tensile strength; ultra-thin diamond-like carbon films; Chemical vapor deposition; Diamond-like carbon; Electric resistance; Electrostatic measurements; Ion beams; Mechanical factors; Nanoelectromechanical systems; Nanomaterials; Nanoscale devices; Testing;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500806