DocumentCode
1858905
Title
Application of ATML test results and intrastage to facilitate intelligent data analysis
Author
Smith, Alisdair ; Wanigaratne, Harsh
Author_Institution
Software Eng., SELEX Galileo Ltd., Edinburgh, UK
fYear
2012
fDate
10-13 Sept. 2012
Firstpage
200
Lastpage
203
Abstract
Many organizations today struggle with getting meaningful insights out of their Test Data. Partly this is due to the complexity of the collection and aggregation of the data, and also partly due to the actual types of data that is recorded at the Test Stations. With some careful planning, the Test Data can be full of rich insights if some standard tags are added to the overall Test Data format.
Keywords
automatic test software; data analysis; organisational aspects; planning (artificial intelligence); program testing; ATML test results; careful planning; data aggregation; intelligent data analysis; intrastage; organizations; standard tags; test data format; test stations; Assembly; Instruments; Materials; Software; Standards; Testing; XML;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4673-0698-0
Type
conf
DOI
10.1109/AUTEST.2012.6334520
Filename
6334520
Link To Document