Title :
Application of ATML test results and intrastage to facilitate intelligent data analysis
Author :
Smith, Alisdair ; Wanigaratne, Harsh
Author_Institution :
Software Eng., SELEX Galileo Ltd., Edinburgh, UK
Abstract :
Many organizations today struggle with getting meaningful insights out of their Test Data. Partly this is due to the complexity of the collection and aggregation of the data, and also partly due to the actual types of data that is recorded at the Test Stations. With some careful planning, the Test Data can be full of rich insights if some standard tags are added to the overall Test Data format.
Keywords :
automatic test software; data analysis; organisational aspects; planning (artificial intelligence); program testing; ATML test results; careful planning; data aggregation; intelligent data analysis; intrastage; organizations; standard tags; test data format; test stations; Assembly; Instruments; Materials; Software; Standards; Testing; XML;
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-0698-0
DOI :
10.1109/AUTEST.2012.6334520
