DocumentCode :
1859013
Title :
Thin-film reliability trends toward improved stability
Author :
Jordan, D.C. ; Kurtz, S.R.
Author_Institution :
Nat. Renewable Energy Lab. (NREL), Golden, CO, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Long-term, stable performance of photovoltaic (PV) modules will be increasingly important to their successful penetration of the power grid. This paper summarizes more than 150 thin-film and more than 1700 silicon PV degradation rates (Rd) quoted in publications for locations worldwide. Partitioning the literature results by technology and date of installation statistical analysis shows an improvement in degradation rate especially for thin-film technologies in the last decade. A CIGS array deployed at NREL for more than 5 years that appears to be stable supports the literature trends. Indoor and outdoor data indicate undetectable change in performance (0.2±0.2 %/yr). One module shows signs of slight degradation from what appears to be an initial manufacturing defect, however it has not affected the overall system performance.
Keywords :
electrical installation; photovoltaic power systems; power grids; power system stability; reliability; semiconductor thin films; solar cell arrays; statistical analysis; CIGS array; Cu(InGa)Se2; degradation rate improvement; indoor data; installation statistical analysis; long-term photovoltaic module performance stability; manufacturing defect; outdoor data; power grid; silicon PV degradation rates; thin film reliability; Arrays; Conferences; Degradation; Photovoltaic systems; Silicon; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186081
Filename :
6186081
Link To Document :
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