• DocumentCode
    1859117
  • Title

    A standards-based approach to gray-scale health assessment using fuzzy fault trees

  • Author

    Donnelly, Patrick J. ; Sturlaugson, Liessman E. ; Sheppard, John W.

  • Author_Institution
    Dept. of Comput. Sci., Montana State Univ., Bozeman, MT, USA
  • fYear
    2012
  • fDate
    10-13 Sept. 2012
  • Firstpage
    174
  • Lastpage
    181
  • Abstract
    As part of a project to examine how current standards focused on test and diagnosis might be extended to address requirements for prognostics and health management, we have been exploring alternatives for incorporating facilities to represent gray-scale health information in the IEEE Std 1232 Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE). In this work, we extend the AI-ESTATE Common Element Model to provide “soft outcomes” on tests and diagnoses. We then demonstrate how to use these soft outcomes with the AI-ESTATE Fault Tree Model to implement a “fuzzy” fault tree. The resulting model then enables isolating faults within a system such that levels of degradation can also be tracked. In this paper, we describe the proposed extensions to AI-ESTATE as well as how those extensions work to implement a fuzzy fault tree using the demonstration circuit from previous Automatic Test Markup Language (ATML) demonstrations.
  • Keywords
    fault trees; fuzzy set theory; medical diagnostic computing; medical information systems; AI-ESTATE Common Element Model; AI-ESTATE fault tree model; ATML; Artificial Intelligence Exchange and Service Tie to All Test Environments; Automatic Test Markup Language; IEEE Std 1232 Standard; fault isolation; fuzzy fault trees; gray-scale health assessment; gray-scale health information; prognostics and health management; soft outcomes; standards-based approach; Decision trees; Fault trees; Gray-scale; Integrated circuit modeling; Standards; Transistors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2012 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-0698-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.2012.6334529
  • Filename
    6334529