DocumentCode :
1859193
Title :
Algorithm development for grain kernel identification
Author :
Visen, Neeraj ; Paliwal, Jitendra ; Jayas, D.S.
Author_Institution :
Dept. of Biosystems Eng., Manitoba Univ., Winnipeg, Man., Canada
Volume :
2
fYear :
2002
fDate :
2002
Firstpage :
963
Abstract :
A digital image analysis algorithm was developed to facilitate classification of individual cereal grain kernels (barley, Canada Western Amber Durum (CWAD) wheat, Canada Western Red Spring (CWRS) wheat, oats, and rye). A total of 230 features (51 morphological, 123 color, and 56 textural) were extracted from 7500 high resolution color images of each type of grain using the developed algorithm. A four-layer back-propagation network (BPN) and k-nearest neighbor statistical classifier were evaluated for classification accuracies. The BPN used a sigmoid scaling function for input nodes and sigmoid activation function for nodes in the hidden layers. The data for statistical analysis was scaled using a normalizing function. Five different data sets were used for training, testing, and validation. The neural network based classifier outperformed the statistical classifier for all grain types. The average classification accuracies using BPN were 98.2, 90.9, 98.6, 98.4, and 99.0% for barley, CWAD wheat, CWRS wheat, oats, and rye, respectively. For the statistical classifier, the average classification accuracies were 85.1, 88.9, 96.9, 95.0, and 96.4% for barley, CWAD wheat, CWRS wheat, oats, and rye, respectively.
Keywords :
agriculture; backpropagation; computer vision; feature extraction; image classification; image colour analysis; image resolution; image texture; statistical analysis; Canada Western Amber Durum wheat; Canada Western Red Spring wheat; algorithm development; barley; cereal grain kernels classification; classification accuracy; color features; data sets; digital image analysis algorithm; four-layer backpropagation network; grain kernel identification; hidden layers; high resolution color images; input nodes; k-nearest neighbor statistical classifier; machine vision systems; morphological features; normalizing function; oats; rye; sigmoid activation function; sigmoid scaling function; statistical analysis; testing; textural features; training; validation; Algorithm design and analysis; Color; Digital images; Image analysis; Image resolution; Kernel; Open area test sites; Springs; Statistical analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2002. IEEE CCECE 2002. Canadian Conference on
ISSN :
0840-7789
Print_ISBN :
0-7803-7514-9
Type :
conf
DOI :
10.1109/CCECE.2002.1013073
Filename :
1013073
Link To Document :
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