DocumentCode
1859478
Title
The thin dielectric film capacitive displacement transducer to nanometer
Author
Castelli, Franco
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
Volume
1
fYear
1998
fDate
18-21 May 1998
Firstpage
150
Abstract
The paper reviews the use of transducers for small displacements (from micrometers to few millimeters) and the advantages of capacitive transducers over other transducers types, and discusses the basic principle of two new transducers de-noted “thin dielectric film capacitive transducer” (TFCT). This principle is based on the properties of a very thin dielectric film between the faced electrodes. The film may be applied, when featured with thickness (TH) TH<1 μm, by metallic dielectric, such as allumina, either in gas phase or by electrolysis deposited form. The transducers are designed in a differential form. Two implementation prototypes (IPs) have been designed. The first one (I°IP) have been constructed for both linear and rotary displacement transducers by a dielectric spray varnish with TH≅2 μm. In the second one (II°IP), in course of construction, a linear displacement transducer has been designed, by a metallic dielectric of allumina deposited by electrolysis with TH≅510-2 μm. The test results obtained on the I°IP and, on this basis previewed for the II°IP are critically analyzed. The sensitivity (S) and linearity (L) in ppm detected and previewed respectively are 5 pF/mm, 0.6 pF/° and 25; ≅40 pF/μm and <1; the features for pursuing an L<0.1 ppm are illustrated as well. Based on these previewed results an absolute both scale of capacitance and capacitive voltage divider are proposed as well
Keywords
dielectric thin films; displacement measurement; electric sensing devices; transducers; 1 mum; 2 mum; Al23; allumina; capacitive voltage divider; dielectric spray varnish; faced electrodes; gas phase; industry; linear displacement transducer; linear displacement transducers; linearity; metallic dielectric; rotary displacement transducers; science; sensitivity; thin dielectric film capacitive displacement transducer; Capacitance; Dielectric films; Electrochemical processes; Electrodes; Linearity; Prototypes; Spraying; Testing; Transducers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location
St. Paul, MN
ISSN
1091-5281
Print_ISBN
0-7803-4797-8
Type
conf
DOI
10.1109/IMTC.1998.679742
Filename
679742
Link To Document