Title :
On-line detection of random voltage perturbations in buses with multiple-threshold receivers
Author :
Skoufis, Michael N. ; Tragoudas, Spyros
Author_Institution :
Raytheon Co., Tucson, AZ, USA
Abstract :
Random voltage changes on bus lines may lead to reading corrupted digital data. A novel methodology for detecting such anomalies is proposed. It uses multiple threshold voltages at the receiver-end. In our earlier work we have shown that multiple voltage thresholds improve the performance along buses, especially when they are coupled as is often the case in deep-submicron. This work shows that multiple thresholds can also be used to identify voltage perturbations on-line. The mechanism is presented assuming that each line can have only one aggressor. The efficiency of the methodology is evaluated for perturbations in single and multiple receiving nodes of a data bus.
Keywords :
system buses; system-on-chip; corrupted digital data; data bus lines; multiple receiving node; multiple threshold voltages; multiple-threshold receivers; on-line detection; on-line voltage perturbations; random voltage perturbations; single receiving node; system-on-chip; Clocks; Couplings; Delay; Receivers; Threshold voltage; Topology; Wire;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560192