DocumentCode :
1859781
Title :
New source measure unit architecture for control loop configurability
Author :
Ortega, Rolando
Author_Institution :
Nat. Instrum. Corp., Austin, TX, USA
fYear :
2012
fDate :
10-13 Sept. 2012
Firstpage :
157
Lastpage :
160
Abstract :
Source-measure units (SMUs) can be extremely susceptible to the electrical characteristics of the unit under test (UUT) that is acting as a load, occasionally leading to marginal stability, sub-optimal settling times, dangerous overshoots, and even sustained oscillation. Surprisingly, very little has been done to address this issue, and most vendors are content to “specify around it”: effectively telling users that if a certain load causes the device to misbehave, they shouldn´t be using that load. In a precision power controller, the load is part of the closed control loop. The impedance of the load then directly affects the overall transfer function and response of the system. If we want to be able to reliably source power into arbitrary loads, we need to have a flexible control loop that can be programmatically reconfigured to match the unit under test. This implies a fundamental re-imagining of the architecture of the SMU. Instead of the traditional analog power control loop with a fixed compensation, we´ve implemented a high-throughput digital power control loop with a configurable transfer function. This is made possible by leveraging compelling trends in field programmable gate arrays (FPGA), converter technologies, and productive software. We will provide an architectural overview of our solution to this problem including an analysis of its key technologies and demonstration of its performance. We will show that not only does this instrument architecture address a problem that has been ignored for years by instrument manufacturers, but does so without sacrificing traditional SMU figures of merit such as density, accuracy, precision, and speed.
Keywords :
automatic test equipment; closed loop systems; compensation; electric variables measurement; field programmable gate arrays; load regulation; power control; transfer functions; SMU architecture; analog power control loop; closed control loop; compensation; configurable transfer function; control loop configurability; converter technology; dangerous overshoot; digital power control loop; electrical characteristics; field programmable gate arrays; figure of merit; flexible control loop; load impedance; marginal stability; oscillation; power controller; productive software; source measure unit; sub-optimal settling time; unit under test; Accuracy; Current measurement; Field programmable gate arrays; Instruments; Nickel; Voltage control; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4673-0698-0
Type :
conf
DOI :
10.1109/AUTEST.2012.6334556
Filename :
6334556
Link To Document :
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