DocumentCode
1859815
Title
Identifying and retrieving distress images from road pavement surveys
Author
Oliveira, Henrique ; Correia, Paulo Lobato
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
57
Lastpage
60
Abstract
This paper proposes a system capable of identifying and retrieving distress images from a road pavement survey image database. A database of images acquired during road pavement surface surveys along Portuguese roads is considered. Regions corresponding to cracks are detected over the acquired images, based on a subdivision of the images into a set of non-overlapping windows, which may be classified as containing cracks, or not. Crack detection results, represented by binary images where windows containing crack pixels are set to one, undergo a second classification stage to distinguish several crack types. This classification follows the structure proposed by the Portuguese Distresses Catalog, produced by the national entity in charge of road maintenance. Three crack types are identified at this stage: longitudinal cracks, transversal cracks and miscellaneous cracks. The experimental results, obtained by processing real survey imagery over Portuguese roads, present encouraging results for automating the process of identifying road distresses from images.
Keywords
civil engineering computing; image classification; image retrieval; maintenance engineering; roads; visual databases; Portuguese Distresses Catalog; Portuguese roads; binary images; crack detection; distress image identification; distress image retrieval; image classification; longitudinal cracks; miscellaneous cracks; nonoverlapping windows; road maintenance; road pavement survey image database; transversal cracks; Bayesian methods; Feature extraction; Humans; Image databases; Image retrieval; Information retrieval; Pixel; Roads; Spatial databases; Surface cracks; crack detection; image analysis; road distress classification; road pavement distresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1522-4880
Print_ISBN
978-1-4244-1765-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2008.4711690
Filename
4711690
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