DocumentCode
1859820
Title
Unconventional reliability growth model
Author
Krajcuskova, Zuzana
Author_Institution
Dept. of Radio Electron., Slovak Univ. of Technol., Bratislava
fYear
2008
fDate
24-25 April 2008
Firstpage
1
Lastpage
4
Abstract
The reliability growth model (RGM) is a very specific tool used during the development phase of electronic devices and software products. The unconventional reliability growth model is based on the homogenity testing of different Poisson process characteristics. This enables to find the time frame for finishing the technological constructing operations for further reliability growth in the next design of an electronic object.
Keywords
circuit reliability; circuit testing; electronic engineering computing; stochastic processes; Poisson process characteristics; electronic devices; homogenity testing; software products; unconventional reliability growth model; Data processing; Electronic circuits; Finishing; Maintenance; Production; Reliability theory; Software tools; Statistics; Stochastic processes; System testing; Poisson theorem; Reliability growth model (RGM); homogenity testing; homogenous and non-homogenous stochastic Poisson process; statistical data processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radioelektronika, 2008 18th International Conference
Conference_Location
Prague
Print_ISBN
978-1-4244-2087-2
Electronic_ISBN
978-1-4244-2088-9
Type
conf
DOI
10.1109/RADIOELEK.2008.4542727
Filename
4542727
Link To Document