Title :
Unconventional reliability growth model
Author :
Krajcuskova, Zuzana
Author_Institution :
Dept. of Radio Electron., Slovak Univ. of Technol., Bratislava
Abstract :
The reliability growth model (RGM) is a very specific tool used during the development phase of electronic devices and software products. The unconventional reliability growth model is based on the homogenity testing of different Poisson process characteristics. This enables to find the time frame for finishing the technological constructing operations for further reliability growth in the next design of an electronic object.
Keywords :
circuit reliability; circuit testing; electronic engineering computing; stochastic processes; Poisson process characteristics; electronic devices; homogenity testing; software products; unconventional reliability growth model; Data processing; Electronic circuits; Finishing; Maintenance; Production; Reliability theory; Software tools; Statistics; Stochastic processes; System testing; Poisson theorem; Reliability growth model (RGM); homogenity testing; homogenous and non-homogenous stochastic Poisson process; statistical data processing;
Conference_Titel :
Radioelektronika, 2008 18th International Conference
Conference_Location :
Prague
Print_ISBN :
978-1-4244-2087-2
Electronic_ISBN :
978-1-4244-2088-9
DOI :
10.1109/RADIOELEK.2008.4542727
