Title :
Robust cryptographic ciphers with on-line statistical properties validation
Author :
Vaskova, Anna ; López-Ongil, Celia ; Jiménez-Horas, Alejandro ; Millán, Enrique San ; Entrena, Luis
Author_Institution :
Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
Abstract :
A new solution is presented for fast measuring of randomness properties of cryptographic algorithms. Statistical Tests from NIST are hardware implemented in order to enable an on-line detection of intentional attacks in cryptographic ciphers. The small area overhead and the short processing times provide a good solution for hardening this type of circuits.
Keywords :
cryptography; program testing; program verification; random number generation; cryptographic algorithm; online statistical property validation; randomness property; robust cryptographic cipher; Algorithm design and analysis; Cryptography; Generators; Hardware; NIST; Software; Software algorithms;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560203
