DocumentCode :
1859869
Title :
Life cycle planning from product development to long term sustainment
Author :
Harnack, Jake
Author_Institution :
PXI & Modular Instrum., Nat. Instrum. Corp., Austin, TX, USA
fYear :
2012
fDate :
10-13 Sept. 2012
Firstpage :
29
Lastpage :
33
Abstract :
One of the major challenges engineers face when developing military test systems is balancing the life cycle mismatch of test equipment that´s commonly deployed for 20+ years with the shorter life cycle of commercial-off-the-shelf (COTS) components often used in those systems. To ensure long term supportability of these systems, it is important to plan for obsolescence issues starting in the product development phase and continuing through the sustaining state to end of life. Successful long term support of test systems requires careful up-front planning, a proper system architecture, and a comprehensive long term life cycle management plan. Software is becoming increasingly more important in long term sustainment as it continues to define more and more of the test system functionality. A key software architecture for mitigating the impact of obsolescence is the implementation of hardware abstraction layers (HALs). A modular software architecture, such as a HAL, is an important proactive component of a life cycle management plan that also includes traditional hardware life cycle management strategies such as sparing, obsolescence tracking and planned technology refreshes. This paper examines some of the techniques used to manage test system obsolescence through HALs and hardware life cycle management.
Keywords :
military equipment; military systems; product life cycle management; software architecture; sustainable development; test equipment; COTS components; HAL implementation; commercial-off-the-shelf components; hardware abstraction layers; hardware life cycle management strategies; life cycle mismatch balancing; long term life cycle management plan; long term sustainment; military test systems; modular software architecture; obsolescence issues; obsolescence tracking; product development; product development phase; software architecture; sparing; test equipment; up-front planning; Aging; Companies; Hardware; Instruments; Planning; Production; Software;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4673-0698-0
Type :
conf
DOI :
10.1109/AUTEST.2012.6334559
Filename :
6334559
Link To Document :
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