Online fault testing of reversible logic using dual rail coding

Research in reversible logic is motivated by its application in quantum computing as well as its promise in extremely low power consumption by elimination of power dissipation due to information loss. In this paper we propose a set of novel dual rail reversible logic gates for online testable reversible logic design. Experimental results show that our technique detects 100% of single faults while reducing the area and the number of garbage outputs up to 6.4X and 4.6X, compared to previously proposed techniques, respectively.