DocumentCode
1859972
Title
A method for detecting resistive opens in buses
Author
Rius, Josep
Author_Institution
Dept. d´´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
fYear
2010
fDate
5-7 July 2010
Firstpage
187
Lastpage
189
Abstract
The method is based on the modification of bus connectivity to force bus oscillation during testing. The oscillation frequency depends on the open resistance and location on the line. Comparison of the frequency with a reference allows the detection and eventual location of the defect. Electrical simulations and preliminary experiments on a test chip show the detection capabilities and the feasibility of the proposed method.
Keywords
logic circuits; logic testing; microprocessor chips; peripheral interfaces; bus connectivity; buses; electrical simulations; force bus oscillation; open resistance; oscillation frequency; resistive open detection; test chip; Capacitance; Delay; Integrated circuit interconnections; Multiplexing; Oscillators; Resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location
Corfu
Print_ISBN
978-1-4244-7724-1
Type
conf
DOI
10.1109/IOLTS.2010.5560210
Filename
5560210
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