Title :
Local growth of carbon nanotubes on the cantilever by chemical vapor deposition with FIB assist etching
Author :
Imaizumi, Yoshiaki ; Arakawa, Yoichiro ; Arai, Fumihito ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Japan
Abstract :
We have controlled the local growth area of the carbon nanotubes (CNTs) on the silicon cantilever using chemical vapor deposition (CVD) with assistance of the focused ion beam (FIB) etching. By removal of the mask layer above the catalyst layer by the FIB, the CNTs were easily grown from the areas of the catalyst layer. This opens a door to the new century of the CNTs device fabrication such as, temperature sensor for the ultra small site, mass flow sensor, CNTs actuator and other various devices.
Keywords :
carbon nanotubes; catalysts; chemical vapour deposition; focused ion beam technology; nanotechnology; sputter etching; C; CNT actuator; CVD; FIB assist etching; Si; carbon nanotubes; catalyst layer; chemical vapor deposition; focused ion beam etching; mass flow sensor; silicon cantilever; temperature sensor; Assembly; Carbon nanotubes; Chemical vapor deposition; Etching; Fabrication; Ion beams; Scanning electron microscopy; Temperature sensors; Transistors; Transmission electron microscopy;
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
DOI :
10.1109/NANO.2005.1500850