• DocumentCode
    1860013
  • Title

    A new framework for the automatic insertion of mitigation structures in circuits netlists

  • Author

    Battezzati, Niccolo ; Serrone, Davide ; Violante, Massimo

  • Author_Institution
    Politec. di Torino, Torino, Italy
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    190
  • Lastpage
    191
  • Abstract
    In this paper we present a new software framework to analyze and modify circuits netlists in an automatic fashion. We developed an API that implements low-level functionalities above which it is possible to create complex algorithms. We then developed a second software layer to implement hardening techniques for Single Event Effects (SEEs) in digital microcircuits. Experimental results prove the effectiveness of the automatic introduction of mitigation techniques.
  • Keywords
    application program interfaces; integrated circuit design; logic design; radiation hardening (electronics); API; automatic insertion; circuits netlists; complex algorithms; digital microcircuits; hardening techniques; low-level functionalities; mitigation structures; single event effects; software framework; software layer; Circuit faults; Field programmable gate arrays; Logic gates; Performance evaluation; Software; Testing; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
  • Conference_Location
    Corfu
  • Print_ISBN
    978-1-4244-7724-1
  • Type

    conf

  • DOI
    10.1109/IOLTS.2010.5560211
  • Filename
    5560211