Title :
A method of combining intermittent arc fault technologies
Author :
Parkey, Charna R. ; Hughes, Craig ; Caulfield, Mike ; Masquelier, Michael P.
Author_Institution :
Astronics DME Corp., Orlando, FL, USA
Abstract :
Intermittent wire faults can be caused by harsh environments, handling or simply aging of the sheathing. These types of faults are difficult to isolate due to the intermittent nature. Recent advances in intermittent fault detection have provided the aerospace and defense industry new methods to test aging aircraft wiring. In particular the use of Low Energy High Voltage (LEHV) methods and Spread Spectrum Time Domain Reflectometry (SSTDR) has shown promise in locating intermittent faults in a variety of situations. These technologies have distinct advantages which best serve the industry in a combined package. This paper presents a novel method of combining these technologies in a portable fashion to solve the growing need for intermittent fault detection.
Keywords :
aerospace industry; arcs (electric); defence industry; fault diagnosis; time-domain reflectometry; wires (electric); LEHV method; SSTDR; aerospace industry; defense industry; harsh environments; intermittent arc fault technology; intermittent wire faults; low energy high voltage method; spread spectrum time domain reflectometry; test aging aircraft wiring; Hardware; Impedance; Instruments; Reflectometry; Software; Wires; Wiring; aging; arc discharges; automatic test equipment; collaboration; fault detection; fault location; reflectometry; vehicle safety;
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-0698-0
DOI :
10.1109/AUTEST.2012.6334571
