Title :
A bit level area aware cache-based architecture for memory repairs
Author :
Axelos, Nicholas ; Pekmestzi, Kiamal
Author_Institution :
Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
Abstract :
In this paper an architecture for memory Built-In Self-Repair (BISR) is presented. The proposed scheme utilises a multiple bank cache-like memory for repairing defective bits and is a heavily modified version of a previously studied architecture that repaired at the word level, while the proposed repairs at the bit level. This scheme achieves high repair ratios at high defect densities with small overheads. The two architectures are compared on their footprint by means of an area approximation analysis. The proposed modified scheme shows significant area savings (greater than 4 times) while retaining the same high repairability qualities as its predecessor.
Keywords :
cache storage; fault tolerant computing; maintenance engineering; memory architecture; area approximation analysis; bit level area aware cache based architecture; defective bits repairing; memory built in self repair; multiple bank cache memory; Circuit faults; Computer architecture; Maintenance engineering; Multiplexing; Random access memory; Redundancy; Transistors;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560217