DocumentCode
1860163
Title
Fault-tolerant solid state mass memory for satellite applications
Author
Cardarilli, G.C. ; Marinucci, P. ; Salsano, A.
Author_Institution
Dept. of Electron. Eng., Rome Univ., Italy
Volume
1
fYear
1998
fDate
18-21 May 1998
Firstpage
253
Abstract
This paper presents a structure of solid state mass memories based on DRAMs, able to collect a large amount of measurement results. It is based on a suitable ECC code to improve the tolerance of the solid state memories to soft and hard errors. This memory will be tested in a satellite designed for a scientific mission. The implementation aspects of ECC are also discussed, and the relation between the code properties and MTBF of the disk are examined in some detail
Keywords
DRAM chips; error correction codes; integrated circuit reliability; space vehicle electronics; DRAMs; ECC code; MTBF; code properties; hard errors; satellite applications; soft errors; solid state mass memory; Error correction; Error correction codes; Extraterrestrial measurements; Fault tolerance; Performance evaluation; Robustness; Satellite ground stations; Single event upset; Solid state circuits; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location
St. Paul, MN
ISSN
1091-5281
Print_ISBN
0-7803-4797-8
Type
conf
DOI
10.1109/IMTC.1998.679768
Filename
679768
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