Title :
Fault-tolerant solid state mass memory for satellite applications
Author :
Cardarilli, G.C. ; Marinucci, P. ; Salsano, A.
Author_Institution :
Dept. of Electron. Eng., Rome Univ., Italy
Abstract :
This paper presents a structure of solid state mass memories based on DRAMs, able to collect a large amount of measurement results. It is based on a suitable ECC code to improve the tolerance of the solid state memories to soft and hard errors. This memory will be tested in a satellite designed for a scientific mission. The implementation aspects of ECC are also discussed, and the relation between the code properties and MTBF of the disk are examined in some detail
Keywords :
DRAM chips; error correction codes; integrated circuit reliability; space vehicle electronics; DRAMs; ECC code; MTBF; code properties; hard errors; satellite applications; soft errors; solid state mass memory; Error correction; Error correction codes; Extraterrestrial measurements; Fault tolerance; Performance evaluation; Robustness; Satellite ground stations; Single event upset; Solid state circuits; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.679768
