DocumentCode :
1860172
Title :
A method for estimating temperature dependent short circuit current
Author :
Wilcox, J.R. ; Haas, A.W. ; Gray, J.L. ; Schwartz, R.J.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Solar cell models that can be embedded easily into optical modeling programs have proven to be useful to study the tradeoffs inherent between the optics and solar cells in concentrating photovoltaic systems. In addition to modeling the optics and photovoltaics at 25°C, system designers would like to study the range of temperatures the system will experience during terrestrial operation. Methods for estimating temperature-dependent open-circuit voltage and fill factor have been shown. This leaves the need to accurately estimate the short-circuit current as a function of temperature. In this paper measured EQE for a GaInP/GaInAs/Ge tandem stack has been used to calculate the short-circuit current over a range of operating temperatures. This method can easily be used to conduct system level analysis in any type of solar cell system from flat plate panels to concentrator photovoltaic systems that contain complicated optics.
Keywords :
gallium compounds; indium compounds; short-circuit currents; solar cells; solar energy concentrators; GaInP-GaInAs-Ge; concentrator photovoltaic systems; flat plate panels; optical modeling programs; optics cells; solar cell models; system designers; system level analysis; tandem stack; temperature 25 degC; temperature dependent short circuit current; temperature-dependent open-circuit voltage estimation; terrestrial operation; Absorption; Junctions; Photonic band gap; Photonics; Photovoltaic cells; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186123
Filename :
6186123
Link To Document :
بازگشت