DocumentCode
1860256
Title
Radiation effects on programmable analog devices and mitigation techniques
Author
Balen, Tiago R. ; Lubaszewski, Marcelo
Author_Institution
Univ. Fed. do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
fYear
2010
fDate
5-7 July 2010
Firstpage
136
Lastpage
136
Abstract
Programmable analog devices are susceptible to radiation effects. TID effects are a matter of concern due to the thickness of oxides in common analog technologies and can be mitigated by HBD techniques and shielding. SEEs may also disturb programmable analog devices, and system level techniques based on on-line error detection and self-correction may be applied by using the available programmable resources of the device.
Keywords
analogue circuits; programmable circuits; radiation effects; semiconductor device testing; HBD technique; TID effect; mitigation technique; programmable analog device; radiation effect; Circuit faults; Field programmable analog arrays; Programming; Radiation effects; Single event upset; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location
Corfu
Print_ISBN
978-1-4244-7724-1
Type
conf
DOI
10.1109/IOLTS.2010.5560221
Filename
5560221
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