• DocumentCode
    1860278
  • Title

    A simulated comparison of turnstile and Poisson photons for x-ray imaging

  • Author

    Melvin, Cameron ; Abdel-Hadi, Karim ; Cenzano, Silvia ; Gordon, R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1165
  • Abstract
    X-rays are used for diagnostic imaging because they produce images with excellent resolution in a cost-effective manner. Due to their carcinogenic potential, however, a trade-off must be made between the amount of x-rays used (dose) and image quality desired Some noise in x-ray images is attributed to the random nature in which x-rays are emitted from a normal x-ray source. So-called turnstile photon devices have been developed, which release photons in a controlled manner, one at a time. A simple Monte Carlo simulation was created to model specimen radiography, or x-ray of a thin slab. The simulation models two different types of x-ray emitters: regular (Poisson statistics) and turnstile. Projected images were produced for a wide range of doses. These images were compared using mean square error and entropy measures. Results show that image quality would be significantly improved or dose reduced if turnstile photon sources were developed to replace conventional x-ray sources.
  • Keywords
    Monte Carlo methods; computerised tomography; diagnostic radiography; dosimetry; entropy; mammography; mean square error methods; photon transport theory; probability; Euclidean distance; Monte Carlo simulation; Poisson photons; X-ray imaging; computed tomography; diagnostic imaging; dose reduction; entropy measures; image quality; mammogram; mean square error measures; multiphoton microscopy; random components; specimen radiography; thin slab; turnstile photons; Entropy; Image quality; Image resolution; Mean square error methods; Optical control; Optical imaging; Radiography; Slabs; Statistics; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2002. IEEE CCECE 2002. Canadian Conference on
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-7514-9
  • Type

    conf

  • DOI
    10.1109/CCECE.2002.1013113
  • Filename
    1013113