Title :
The analysis of the relation between return voltage parameters and the dipole distribution function in dielectrics
Author_Institution :
Dept. of Electr. Eng., Suez-Canal Univ., Port-Said, Egypt
Abstract :
The physical meaning of the empirical Okamoto equation, which has been used to verify the front shape of return voltage measured values, is correctly analyzed in relation to the dipole distribution in dielectrics. It is shown that there is a strong relation between the parameters of this equation and the shape of the distribution function of relaxation times. The measuring parameter (short-circuit time) also has a great influence of the equation parameters. According to the obtained theoretical results an interpretation of dielectric aging can be formulated
Keywords :
dielectric measurement; Okamoto equation; dielectric aging; dipole distribution function; insulation diagnostics; relaxation times; return voltage measurement; short-circuit time; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Distribution functions; Equations; Equivalent circuits; Polarization; Shape measurement; Time measurement; Voltage fluctuations;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.592054
