Title :
Negative mass effects in Brillouin flows
Author :
Simon, David H. ; Lau, Y.Y. ; Greening, Geoff ; Gilgenbach, Ronald M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
The Brillouin flow is the dominant flow in crossed-field devices. We systematically study its stability in conventional, planar, and inverted magnetron. We found that the negative mass effect in the inverted magnetron tends to destabilize the planar flow, and that the positive mass effect in the conventional magnetron tends to stabilize the planar flow.
Keywords :
magnetrons; Brillouin flows; conventional magnetron; crossed-field devices; dominant flow; inverted magnetron; negative mass effects; planar flow; planar magnetron; positive mass effect; Anodes; Cathodes; Electromagnetics; Electrostatics; Magnetic resonance imaging; Scattering; Stability analysis; Brillouin flow; magnetron; negative mass instability;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
DOI :
10.1109/IVEC.2015.7223792
