Abstract :
JESD89A has been issued in 2006 as the revised version of JESD89, in which alpha-ray, thermal neutron, spallation neutron, (quasi-mono) energetic neutron and high-altitude/underground field tests are described more reasonable way compared to the original JESD89. SERs in logic devices, field programmable gate arrays (FPGAs) were discussed to a certain degree but test methods were not defined. EIAJ EDR4705 has been issued in 2005 with similar scope with JESD89A as the Japanese guideline. IEC60749-38 has been issued with similar scope with JESD89A in 2008. Basic concepts in JESD89A are accepted worldwide as such. Some recent works after 2009, however, have revealed that basic assumptions in JESD89A as exemplified below may not be true anymore beyond 90nm generations.
