Title :
New electrical connection technology for microsystems using inktelligent printing® and functional nanoscaled INKS
Author :
Sturm, H. ; Sosna, C. ; Buchner, R. ; Werner, C. ; Godlinski, D. ; Zöllmer, V. ; Busse, M. ; Lang, W.
Author_Institution :
IMSAS (Inst. for Microsensors, -actuators & -Syst.), Univ. of Bremen, Bremen, Germany
Abstract :
A new electrical connection technology for highly miniaturized systems based on functional printing has been studied. INKtelligent printingreg with its ability to print structures in micrometer size uses electrically conductive inks with functional nanoparticles to provide MEMS devices with electrical contacts. Due to large dimensions of conventional packaging technologies like flip chip or wire bonding, INKtelligent printingreg will dramatically increase size of assembled systems. Here, an aerosol beam technology - also known as Maskless Mesoscale Material Deposition (M3Dreg) or Aerosol Jetreg - is presented. Tests have been done to characterize conductivity, contact resistance, long term stability and temperature dependency as also applications with flow sensors.
Keywords :
contact resistance; electrical conductivity; electronics packaging; flow sensors; ink jet printing; micromechanical devices; nanoparticles; nanostructured materials; MEMS devices; aerosol beam technology; aerosol jet; contact resistance; electrical connection technology; electrical contacts; electrically conductive inks; flip chip packaging; flow sensor applications; functional nanoparticles; functional nanoscaled inks; highly miniaturized systems; inktelligent printing; long term stability; maskless mesoscale material deposition; microsystems; temperature dependency; wire bonding packaging; Aerosols; Contacts; Flip chip; Ink; Microelectromechanical devices; Nanoparticles; Packaging; Printing; Temperature sensors; Wire; conductive inks; functional printing; nanoparticles; nanoscaled inks;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
DOI :
10.1109/SENSOR.2009.5285760