• DocumentCode
    1860462
  • Title

    An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits

  • Author

    Maliuk, Dzmitry ; Stratigopoulos, Haralampos -G ; Makris, Yiorgos

  • Author_Institution
    Electr. Eng. Dept., Yale Univ., New Haven, CT, USA
  • fYear
    2010
  • fDate
    5-7 July 2010
  • Firstpage
    71
  • Lastpage
    76
  • Abstract
    A proof-of-concept hardware neural network for the purpose of analog built-in self-test is presented. The network is reconfigurable into any one-hidden-layer topology within the constraints of the number of inputs and neurons. Analog operation domain of synapses and neurons in conjunction with the digital weight storage allow fast computational time, low power consumption and fast training cycle. The network is trained in the chip-in-the-loop fashion with the simulated annealing-based parallel weight perturbation training algorithm. Its effectiveness in learning how to separate nominal from faulty circuits is investigated on two case studies: a Butterworth filter and an operational amplifier. The results are compared to those of the software neural networks of equivalent topologies and limitations concerning the practical applicability are discussed.
  • Keywords
    Butterworth filters; VLSI; analogue integrated circuits; built-in self test; integrated circuit reliability; integrated circuit testing; multilayer perceptrons; neural chips; operational amplifiers; simulated annealing; Butterworth filter; analog VLSI multilayer perceptron; analog built-in self-test; analog circuits; chip-in-the-loop fashion; digital weight storage; faulty circuits; low power consumption; one-hidden-layer topology; operational amplifier; parallel weight perturbation training algorithm; proof-of-concept hardware neural network; simulated annealing; software neural networks; Artificial neural networks; Built-in self-test; Hardware; Neurons; Software; System-on-a-chip; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
  • Conference_Location
    Corfu
  • Print_ISBN
    978-1-4244-7724-1
  • Type

    conf

  • DOI
    10.1109/IOLTS.2010.5560230
  • Filename
    5560230