DocumentCode
1860479
Title
Leveraging IVI for instrument wrapper development
Author
Lopes, Teresa P.
Author_Institution
Teradyne, Inc., North Reading, MA, USA
fYear
2012
fDate
10-13 Sept. 2012
Firstpage
144
Lastpage
146
Abstract
Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.
Keywords
automatic testing; abstraction layer; automatic test system; instrument wrapper development; leveraging IVI; Aging; Computer architecture; Hardware; Instruments; Software; Software architecture; Standards; IVI; interchangeability; wrapper;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4673-0698-0
Type
conf
DOI
10.1109/AUTEST.2012.6334583
Filename
6334583
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