DocumentCode :
1860479
Title :
Leveraging IVI for instrument wrapper development
Author :
Lopes, Teresa P.
Author_Institution :
Teradyne, Inc., North Reading, MA, USA
fYear :
2012
fDate :
10-13 Sept. 2012
Firstpage :
144
Lastpage :
146
Abstract :
Most Automatic Test System environments create an abstraction layer that sits between the test program and the instruments drivers, a wrapper. This paper provides an overview of existing wrapper implementations, describes the benefits of abstraction layers, primarily to facilitate instrument replacement, and explores using the architecture defined by IVI to implement wrappers. Use of both existing IVI classes and new custom classes are discussed.
Keywords :
automatic testing; abstraction layer; automatic test system; instrument wrapper development; leveraging IVI; Aging; Computer architecture; Hardware; Instruments; Software; Software architecture; Standards; IVI; interchangeability; wrapper;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2012 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
978-1-4673-0698-0
Type :
conf
DOI :
10.1109/AUTEST.2012.6334583
Filename :
6334583
Link To Document :
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