• DocumentCode
    1860541
  • Title

    Ion implanted boron emitter N-silicon solar cells with wet oxide passivation

  • Author

    Ho, W.S. ; Huang, Yuan-Hao ; Hsu, W.-W. ; Chen, Ying-Yu ; Liu, C.W.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    An ion implanted boron emitter silicon solar cell is demonstrated. By using appropriate annealing condition, the implanted dopants and damage introduced by the implantation can be activated and repaired, respectively. Both the rapid thermal annealing (RTA) and furnace annealing were investigated within this work. For the surface passivation and the antireflection coating, the wet oxide (SiO2) was grown during the furnace annealing step. Since the wet oxidation process has about one order of magnitude faster than the dry oxidation process, it could be a suitable technology for industrial silicon solar cell processing. The rapid thermal annealing with various temperatures and annealing time were also investigated. The open-circuit voltage increased with increasing the temperature and time of the RTA process. The planar p+nn+ solar cell with wet oxide passivaiton achieves the Voc of 0.631 V and the efficiency of 15.43%.
  • Keywords
    boron; ion implantation; oxidation; passivation; rapid thermal annealing; silicon compounds; solar cells; N-silicon solar cells; RTA; SiO2; antireflection coating; furnace annealing; ion implanted boron emitter; open-circuit voltage; oxidation process; rapid thermal annealing; voltage 0.631 V; wet oxide passivation; Boron; Furnaces; Photovoltaic cells; Rapid thermal annealing; Silicon; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186134
  • Filename
    6186134