Brightness of electron beam from a small carbon nanotube emitter fabricated using the probe contact method

Author

Min-Sik Shin ; Young Chul Choi ; Jun-Tae Kang ; Hyojin Jeon ; Jae-Woo Kim ; Sora Park ; Sungyoul Choi ; Jin-Woo Jeong ; Ji-Hwan Yeon ; Seungjoon Ahn ; Yoon-Ho Song

Author_Institution

Nano-Electron Source Creative Res. Center, Electron. & Telecommun. Res. Inst., Daejeon, South Korea

fYear

2015

fDate

27-29 April 2015

Firstpage

1

Lastpage

2

Abstract

A novel method for fabricating a small-sized carbon nanotube (CNT) emitter was developed. The emitter was fabricated by contacting the tungsten probe covered with CNT paste to the surface of Kovar rod, and then the brightness of electron beam generated from the CNT paste emitter was measured. We obtained the virtual source size of 1.13 × 10^-10 m² and the brightness of 1.2 × 10⁷ A m^-2sr^-1 at an applied voltage of 3,100 V.

Keywords

carbon nanotubes; electron beams; electron probes; CNT emitter; Kovar rod surface; carbon nanotube emitter; electron beam brightness; probe contact method; voltage 3100 V; Brightness; Carbon nanotubes; Cathodes; Electron beams; Logic gates; Probes; Tungsten; brightness; carbon nanotube; field emission; field emitter; probe contact method; virtual source size;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2015 IEEE International

Conference_Location

Beijing

Print_ISBN

978-1-4799-7109-1

Type

conf

DOI

10.1109/IVEC.2015.7223800

Filename

7223800