DocumentCode :
1860548
Title :
Brightness of electron beam from a small carbon nanotube emitter fabricated using the probe contact method
Author :
Min-Sik Shin ; Young Chul Choi ; Jun-Tae Kang ; Hyojin Jeon ; Jae-Woo Kim ; Sora Park ; Sungyoul Choi ; Jin-Woo Jeong ; Ji-Hwan Yeon ; Seungjoon Ahn ; Yoon-Ho Song
Author_Institution :
Nano-Electron Source Creative Res. Center, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
2
Abstract :
A novel method for fabricating a small-sized carbon nanotube (CNT) emitter was developed. The emitter was fabricated by contacting the tungsten probe covered with CNT paste to the surface of Kovar rod, and then the brightness of electron beam generated from the CNT paste emitter was measured. We obtained the virtual source size of 1.13 × 10-10 m2 and the brightness of 1.2 × 107 A m-2sr-1 at an applied voltage of 3,100 V.
Keywords :
carbon nanotubes; electron beams; electron probes; CNT emitter; Kovar rod surface; carbon nanotube emitter; electron beam brightness; probe contact method; voltage 3100 V; Brightness; Carbon nanotubes; Cathodes; Electron beams; Logic gates; Probes; Tungsten; brightness; carbon nanotube; field emission; field emitter; probe contact method; virtual source size;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
Type :
conf
DOI :
10.1109/IVEC.2015.7223800
Filename :
7223800
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1860548
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