Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies

Author

Heron, O. ; Guilhemsang, J. ; Ventroux, N. ; Giulieri, A.

Author_Institution

CEA, LIST, Gif-sur-Yvette, France

fYear

2010

fDate

5-7 July 2010

Firstpage

49

Lastpage

55

Abstract

Advances in DSM technologies have a negative impact on yield and reliability of digital circuits. On-line self-testing is an interesting solution for detecting permanent and intermittent faults in non safety critical and real-time embedded multiprocessors. In this paper, we describe and evaluate three scheduling and allocation policies for on-line self-testing. We show that a policy that periodically applies a test procedure to the different processors in a way that considers idle times, test history of processors and task priorities offers a good trade-off between performance and fault detection probability.

Keywords

embedded systems; fault diagnosis; integrated circuit reliability; integrated circuit testing; integrated circuit yield; microprocessor chips; multiprocessing systems; resource allocation; scheduling; DSM technologies; allocation policies; digital circuit reliability; digital circuit yield; fault detection probability; negative impact; nonsafety critical multiprocessors; on-line self-testing policies; real-time embedded multiprocessors; scheduling; Built-in self-test; Circuit faults; Computer architecture; Fault detection; Integrated circuits; Program processors; Resource management; DSM technology; MPSoC; on-line self-testing;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International

Conference_Location

Corfu

Print_ISBN

978-1-4244-7724-1

Type

conf

DOI

10.1109/IOLTS.2010.5560235

Filename

5560235