• DocumentCode
    1860592
  • Title

    MMIC designers trained on real chips without expensive fabrication

  • Author

    Hwang, J.C.M.

  • Author_Institution
    Lehigh Univ., Bethlehem, PA, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    7-12 June 1998
  • Firstpage
    551
  • Abstract
    Without many lengthy and expensive design/fabrication/test iterations, we have trained a number of MMIC designers who can contribute to the industry even before they graduate. The approach involves mainly large-signal modeling and internal-node microwave waveform probing of existing MMIC chips. Typically, it starts by a company asking us to help diagnose a certain MMIC. Students then extract large-signal transistor models themselves and use the models to simulate the internal-node waveforms of the MMIC. By comparing the modeled and measured results, students gain insight of the MMIC working principles. Next, design improvement is suggested and verified by novel cutting and pasting techniques. Lastly, by focusing on microwave waveforms students are proficient in both frequency- and time-domain techniques, making them particularly suitable for modern wireless communication applications which involve complex signal-modulation schemes.
  • Keywords
    MMIC; MMIC designers; cutting/pasting techniques; frequency-domain techniques; internal-node microwave waveform probing; large-signal modeling; students; time-domain techniques; training; transistor models; Fabrication; Frequency; Gain measurement; Industrial training; MMICs; Microwave theory and techniques; Microwave transistors; Semiconductor device measurement; Testing; Textile industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1998 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-4471-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1998.705053
  • Filename
    705053