DocumentCode :
1860592
Title :
MMIC designers trained on real chips without expensive fabrication
Author :
Hwang, J.C.M.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Volume :
2
fYear :
1998
fDate :
7-12 June 1998
Firstpage :
551
Abstract :
Without many lengthy and expensive design/fabrication/test iterations, we have trained a number of MMIC designers who can contribute to the industry even before they graduate. The approach involves mainly large-signal modeling and internal-node microwave waveform probing of existing MMIC chips. Typically, it starts by a company asking us to help diagnose a certain MMIC. Students then extract large-signal transistor models themselves and use the models to simulate the internal-node waveforms of the MMIC. By comparing the modeled and measured results, students gain insight of the MMIC working principles. Next, design improvement is suggested and verified by novel cutting and pasting techniques. Lastly, by focusing on microwave waveforms students are proficient in both frequency- and time-domain techniques, making them particularly suitable for modern wireless communication applications which involve complex signal-modulation schemes.
Keywords :
MMIC; MMIC designers; cutting/pasting techniques; frequency-domain techniques; internal-node microwave waveform probing; large-signal modeling; students; time-domain techniques; training; transistor models; Fabrication; Frequency; Gain measurement; Industrial training; MMICs; Microwave theory and techniques; Microwave transistors; Semiconductor device measurement; Testing; Textile industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-4471-5
Type :
conf
DOI :
10.1109/MWSYM.1998.705053
Filename :
705053
Link To Document :
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