Title :
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts
Author :
Rech, P. ; Grosso, M. ; Melchiori, F. ; Loparco, D. ; Appello, D. ; Dilillo, L. ; Paccagnella, A. ; Reorda, M. Sonza
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
Abstract :
This paper reports and analyzes the results of alpha radiation testing campaigns on an embedded microprocessor manufactured with different standard cell libraries, each one enforcing Design for Manufacturing rules at a specific level. A set of analog simulations has been performed on flip-flops built with different physical layouts to reproduce and evaluate the effects of ionizing particles. The results of simulation experiments are presented and discussed, highlighting the configurations which are more likely to improve the system reliability, and then compared with radiation experiments data. Finally, we give a physical interpretation of the observed variations on radiation sensitivity.
Keywords :
alpha-particle effects; design for manufacture; embedded systems; flip-flops; integrated circuit layout; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; microprocessor chips; radiation hardening (electronics); alpha radiation testing; alpha sensitivity variation; analog simulations; cell layout; design for manufacturing; embedded microprocessor; flip flops; ionizing particle effect; radiation sensitivity; system reliability; Error analysis; Flip-flops; Layout; Libraries; Microprocessors; Optimization; Transistors; Design for Manufacturing; Single Event Upset; microprocessor; radiation testing;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560236
