• DocumentCode
    1860676
  • Title

    Minimized blurring in stencil lithography using a compliant membrane

  • Author

    Sidler, K. ; Villanueva, G. ; Vazquez-Mena, O. ; Brugger, J.

  • Author_Institution
    Microsyst. Lab., Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    1612
  • Lastpage
    1615
  • Abstract
    This work reports on advanced stencil lithography using compliant membranes. Compliant membranes are mechanically decoupled from a rigid silicon frame by means of four non planar cantilevers. Compliant membranes are protruding parts which adapt to the surface independently in order to reduce the gap between a membrane and its substrate. FEM simulations show that compliant membranes can vertically deflect 40 mum which is a typical maximal gap. Microapertures were defined using UV lithography and nanoapertures, down to 200 nm in diameter, using FIB. A 100 nm thick aluminum layer was evaporated through compliant and non compliant membranes on a silicon wafer. Subsequent SEM characterizations have shown a smaller halo diameter around the structures patterned by compliant membranes.
  • Keywords
    aluminium; cantilevers; finite element analysis; focused ion beam technology; scanning electron microscopy; silicon; ultraviolet lithography; Al; FEM simulations; FIB; SEM; Si; UV lithography; aluminum layer; compliant membrane; microapertures; minimized blurring; nanoapertures; nonplanar cantilevers; rigid silicon frame; silicon wafer; stencil lithography; Apertures; Biomembranes; Dry etching; Fabrication; Geometry; Lithography; Resists; Silicon compounds; Solid modeling; Substrates; Stencil lithography; blurring; compliant membrane; nano-apertures; shadow mask;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285768
  • Filename
    5285768