DocumentCode :
1860705
Title :
Materials deposition and patterning methods for advanced solar cell architectures
Author :
Kelman, M. ; Tai, E. ; Meisel, A. ; Antoniadis, H.
Author_Institution :
Innovalight Inc., Sunnyvale, CA, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Advanced solar cell architectures often require the deposition of multiple materials on the wafer surface with precise alignment that is maintained during extended manufacturing runs. In this paper, we will review the challenges of maintaining precise and accurate patterning and describe the performance of the patterning technologies implemented in the Innovalight Cougar™ Platform [1]. We will show that with proper selection of screens, screen manufacturing and printing conditions, it is possible to maintain cumulative pattern distortion under 50 microns for up to 8,000 prints. We will describe the design rules required for the deposition of the Silicon (Si) Ink and metal patterns to maintain device performance over extended manufacturing runs. In the Cougar Platform, screen distortion over time can be compensated by increasing the Si Ink line width, with minimal impact on device efficiency. We demonstrate that the design rules necessary to accommodate all distortions result in less than 0.1% efficiency loss as compared to the ideal case.
Keywords :
printing; solar cells; advanced solar cell architecture; cumulative pattern distortion method; ink line width; innovalight cougar platform; multiple material deposition; printing condition; screen distortion; screen manufacturing; size 50 micron; wafer surface; Ink; Metals; Photovoltaic cells; Printing; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186140
Filename :
6186140
Link To Document :
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