Title : 
Characterization and comparison of noise generation for quasi-resonant and pulse-width modulated converters
         
        
            Author : 
Hsiu, Lengnien ; Goldman, Matthew ; Witulski, Arthur F. ; Kerwin, William ; Carlsten, Ronald
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
         
        
        
        
        
        
            Abstract : 
A buck converter with a given output filter is operated with pulsewidth modulated (PWM) and quasi-resonant switching schemes at the same nominal load and switching frequency. Electromagnetic interference (EMI) generated by the natural switching action of the converter is examined by spectral analysis. Interference caused by excitation of parasitic elements is examined experimentally. Quasi-resonant converters are found to have a lower switching frequency harmonic bandwidth than the equivalent PWM converter. The most significant parasitic responses are the turn-on current and turn-off voltage of the catch diode, and the gate current of the MOSFET. A significant decrease in radiated and conducted noise is obtained when the gate drive voltage rise and fall times are increased, which is possible without loss of efficiency using quasi-resonant switching
         
        
            Keywords : 
electromagnetic interference; power convertors; pulse width modulation; switching; EMI; MOSFET; PWM; buck converter; catch diode; electromagnetic interference; gate current; gate drive voltage; noise generation; pulsewidth modulation; quasi-resonant switching; spectral analysis; switching frequency harmonic bandwidth; turn-off voltage; turn-on current; Buck converters; Character generation; Electromagnetic interference; Filters; Noise generators; Pulse width modulation; Pulse width modulation converters; Switching converters; Switching frequency; Voltage;
         
        
        
        
            Conference_Titel : 
Power Electronics Specialists Conference, 1991. PESC '91 Record., 22nd Annual IEEE
         
        
            Conference_Location : 
Cambridge, MA
         
        
            Print_ISBN : 
0-7803-0090-4
         
        
        
            DOI : 
10.1109/PESC.1991.162721