• DocumentCode
    1860765
  • Title

    Automatic tuning via Kriging-based optimization of methods for fault detection and isolation

  • Author

    Marzat, Julien ; Walter, Éric ; Piet-Lahanier, Hélène ; Damongeot, Frédéric

  • Author_Institution
    ONERA-DPRS, Palaiseau, France
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    505
  • Lastpage
    510
  • Abstract
    All the methods for Fault Detection and Isolation (FDI) involve internal parameters, often called hyperparameters, that have to be carefully tuned. Most often, tuning is ad hoc and this makes it difficult to ensure that any comparison between methods is unbiased. We propose to consider the evaluation of the performance of a method with respect to its hyperparameters as a computer experiment, and to achieve tuning via global optimization based on Kriging and Expected Improvement. This approach is applied to several residual-evaluation (or change-detection) algorithms on classical test-cases. Simulation results show the interest, practicability and performance of this methodology, which should facilitate the automatic tuning of the hyperparameters of a method and allow a fair comparison of a collection of methods on a given set of test-cases. The computational cost turns out to be much lower than the one obtained with other general-purpose optimization methods such as genetic algorithms.
  • Keywords
    fault diagnosis; genetic algorithms; Kriging-based optimization; automatic tuning; expected improvement; fault detection; fault isolation; general-purpose optimization; genetic algorithm; global optimization; hyperparameter; Biological system modeling; Computational modeling; Computers; Correlation; Cost function; Tuning; Kriging; change detection; efficient global optimization; fault detection and isolation; hyperparameter; method adjustment; parameter tuning; residual evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Fault-Tolerant Systems (SysTol), 2010 Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    978-1-4244-8153-8
  • Type

    conf

  • DOI
    10.1109/SYSTOL.2010.5676075
  • Filename
    5676075